Section: Research Program

Modelling and simulation for the characterization of advanced materials

We have continued our informal collaboration with the service de Caractérisation des Matériaux et Composants of CEA, LETI, Minatec initiated in 2017. The collaboration with LETI will offer numerous possibilities of very precise (sub-nanometric) experimental comparisons based on the High-resolution scanning transmission electron microscopy (HRSTEM) using one of the best microscopes on the market (the FEI Titan Ultimate microscope). In this context, we have developed a set of tools tools to manipulate, simulate and measure nanomaterials, with a special focus on crystals that appears in many new materials such as semiconductors. The description of the sublines of research explored so far are detailed below.