Section: Application Domains

Reliability

Participants : Jean-Baptiste Durand, Stéphane Girard.

Reliability and industrial lifetime analysis are applications developed through collaborations with the EDF research department and the LCFR laboratory (Laboratoire de Conduite et Fiabilité des Réacteurs) of CEA / Cadarache. We also consider failure detection in print infrastructure [16] through collaboration with Xerox, Meylan.