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Team Serpico


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Team Serpico


Contracts and Grants with Industry
Bibliography


Section: Scientific Foundations

Dynamic analysis and trajectory computation

Motion analysis and tracking

In time-lapse microscopy, the challenge is to detect and track moving objects. Classical tracking methods have limitations as the number of objects and clutter increase. It is necessary to correctly associate measurements with tracked objects, i.e. to solve the difficult data association problem [33] . Data association even combined with sophisticated particle filtering techniques [38] or matching techniques [35] is problematic when tracking several hundreds of similar objects with variable velocities. Developing new optical flow and tracking methods and models in this area is then very stimulating since the problems we have to solve, are really challenging and new for applied mathematics. The goal is to formulate the problem of optical flow estimations in ways that take physical causes of brightness violations into account [25] , [28] . In addition, the interpretation of computed flow fields enables to provide spatio-temporal signatures of particular dynamic processes and could help to complete the traffic modelling.

Event detection

Several approaches can be considered for the automatic detection of appearing and vanishing particles (or spots) in wide-field (WF) and TIRF microscopy images. The difficulty is to distinguish motions due to trafficking from the appearing and vanishing spots. Ideally this could be performed by tracking all the vesicles contained in the cell [38] , [26] . Among the methods proposed to detect particles in microscopy images [39] , [37] , none is dedicated to the detection of a small number of particles appearing or disappearing suddenly between two time steps. Our way of handling small blob appearances/dis-appearances originates from the observation that two successive images are redundant and that occlusions correspond to blobs in one image which cannot be reconstructed from the other image [1] (see also [23] ). Complementary approaches in the line of work described in [12] are currently investigated to provide new results in wide-field and total internal reflection microscopy.